Intersecting lines form known reference intersections across the field. Pitch, line width and orthogonality control the geometry used by the imaging system.
Specify optical glass or fused silica, overall dimensions, thickness, pattern-side orientation and the clear aperture. Define transmission, reflectance or optical density at the working wavelength when optical contrast is critical.
Grid intersections provide repeatable locations for comparing spacing, alignment and image geometry. In an eyepiece, specimen dimensions require calibration; an external calibration grid instead sits in the object scene.
Calibrate eyepiece divisions against a stage scaleSpecify X/Y pitch, orthogonality, cumulative spacing and the grid origin relative to the mounting datum. Equal nominal cell size does not establish coordinate accuracy over the full field.
Separate line width, pitch and placement tolerancesIntersecting lines form known reference intersections across the field. Pitch, line width and orthogonality control the geometry used by the imaging system.
Choose a grid to divide an observation field into known regions, compare spacing or support image-coordinate measurements. Use a counting chamber instead when a liquid volume must be defined.
An eyepiece grid is an internal coordinate reference; an external grid target is imaged at the object plane. A counting grid additionally follows a sampling rule. Pitch and orthogonality support geometric measurement, while chamber depth is relevant only to volume counting.
X/Y pitch, grid extent, line width, orthogonality, origin, numbering and placement relative to the mounting datum can be defined independently.
A patterned glass reference component with the selected graduations, outline and mounting dimensions, accompanied by the specified inspection records.
Instrument-integrated coordinate and alignment references.
Precision grid reticles provide line intersections, spacing and orthogonal directions as optical coordinate references.
Choose pitch, line width, usable area and origin. Add labels or locating marks when repeated positioning is required.
X/Y pitch, line width, grid count, active area, orthogonal axes, origin and mounting outline.
A precision grid emphasises geometry and coordinates. A counting grid must also match the sampling area and boundary rules of the counting method.