Reticles

Microscope eyepiece reticles, measurement graticules, patterned glass grids and custom optical reference patterns for observation, alignment and calibration.

Find the right product for the task

Task or choiceProduct routeWhy it matters
Centre or aimCrosshair / quadrant / concentric circlesPlace a visible reference in the optical image to compare centre, direction or symmetry.
Measure length or angleGraduated scale / crossed scale / protractorSelect the measured quantity and calibrate specimen-plane length when using eyepiece divisions.
Count or sampleGrid / point array / stereology patternThe pattern supports a sampling method; area counting alone does not define a liquid volume.
Compare a featureParticle / grain / inclusion referencesMatch the comparison pattern and microscope setup to the particular examination method.

Bring the selected options into one specification

  • Pattern artwork and reference features
  • Clear aperture and substrate dimensions
  • Feature size, scale and registration
  • Contrast, cleanliness and inspection criteria
DWG drawing and order checklist

Put the right reference in your field of view.

TL OPTIK turns scales, crosshairs and precision grids into instrument components. For observation, alignment or counting, define the useful field, line width and graduation spacing first. We then review substrate dimensions, pattern orientation and mounting references against your instrument drawing.

Discuss your reticle design

Selection notes

Reticles and graticules introduce scales, crosshairs, circles or grids into an optical field for observation, alignment and measurement.

Search