A reticle is an internal reference

An internal reticle is seen with the instrument image. An external test target is placed in the object scene. Choose the product around that optical role before selecting a pattern.

Reticles and external targets in the optical path

Classify the function before choosing geometry

Match the visible reference to the quantity being read: a centre, length, angle, sampled area or comparison class.

Function and primary output
Pattern functionPrimary outputProduct choices
Aiming and alignmentCentre, axis or offsetCrosshairs, quadrants and concentric circles
Measurement and scaleLength or angle after calibrationMicrometer scales, crossed scales and protractors
Counting and samplingDefined fields or method-specific estimatesCounting grids, points and test lines

Define the focal plane and substrate stack

The patterned film, glass thickness, seat and any bonded cover form one optical stack. Its reference plane determines how the pattern is seen with the target image.

Pattern-plane and mounting relationships

Position accuracy and line width are different

Line width governs visibility; pitch governs repeated intervals; placement locates the pattern to the instrument datum. State and inspect these quantities separately.

Line, pitch and placement inspection

Eliminate parallax at the instrument

A clear pattern and a clear target can still move relative to one another when the eye moves. Eyepiece focus and target-plane alignment address different conditions.

Diagnose focus and residual parallax

Calibrate measurement and counting patterns

Length scales need an instrument-specific conversion. Volume counting also needs the sampled area, chamber depth and dilution. The reference geometry and the reported result are connected by the measurement method.

Area, depth and concentration calculations

Specify illumination and polarity

Choose clear or opaque features for the actual wavelength, viewing side and illumination geometry. Transmission density and reflected contrast describe different optical behaviour.

Contrast under the working illumination

Use a release checklist

Connect the drawing revision, pattern dimensions, mounting datums and inspection record. Then verify focus, orientation and readout in the assembled instrument.

What a dimensional record establishes

Explore the related product ranges

Reticles, Graticules & Precision GridsStage Micrometers & Calibration Scales

Related technical guides

Reticle Focal Planes, Parallax and Optical AlignmentReticles in Microscopes, Sights and Measuring InstrumentsReticle Pattern Manufacture and AcceptanceReticle Mounting and Cemented Optical Assemblies