Technical Guides

Choose substrates and coatings, prepare DWG drawings and define measurable pattern and inspection requirements.

How to Specify a Custom Patterned Glass Component

Turn the optical task into a DWG drawing with usable datums, pattern requirements and acceptance criteria.

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Choose the requirement you need to resolve

Preparing DWG Drawings for Patterned Glass

Prepare CAD geometry that preserves scale, polarity, datums and layer meaning through drawing review and manufacture.

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Pattern Accuracy, Datums and Orientation

Separate line width, pitch, pattern position and system accuracy, then express each requirement against a measurable datum.

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Inspection and Acceptance of Patterned Glass

Define inspection areas, defect significance, measurement conditions and report content before comparing pass/fail results.

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Bonded Reticles: Protecting the Patterned Focal Plane

How a bonded cover glass protects a reticle pattern, what it changes in the optical path, and what to specify in the drawing.

Glass Encoder Disc Selection: A Practical Checklist

Define the code pattern, reading geometry and acceptance requirements before ordering a patterned glass encoder disc.

Choosing Glass Substrates and Optical Coatings

Evaluate wavelength, thermal drift, mounting and film behaviour together instead of choosing glass by name alone.

Preparing DWG Drawings for Patterned Glass

Prepare CAD geometry that preserves scale, polarity, datums and layer meaning through drawing review and manufacture.

How to Choose an Optical Test Target

Compare USAF 1951, slanted-edge MTF, Siemens stars, dot arrays, checkerboards and stage micrometers by the quantity you need to measure.

Pattern Accuracy, Datums and Orientation

Separate line width, pitch, pattern position and system accuracy, then express each requirement against a measurable datum.

Inspection and Acceptance of Patterned Glass

Define inspection areas, defect significance, measurement conditions and report content before comparing pass/fail results.

Patterned Glass and Photolithography Glossary

Plain-language definitions for photomasks, encoder discs, reticles, calibration targets and the measurements used to specify them.

Eyepiece Reticles: Selection, Fit and Calibration

Choose the pattern and mounting fit, then convert eyepiece divisions into specimen measurements with a stage micrometer.

Dot Array or Checkerboard: Choosing a Camera Calibration Target

Compare feature geometry, software conventions, target size and validation before choosing a planar camera calibration pattern.

Pattern Polarity, Film Side and Viewing Direction

Define clear and opaque regions, illumination mode and the required reading side without confusing a film opening with a hole through glass.

Siemens Star Testing: Focus, Frequency and Image Interpretation

Convert radius to spatial frequency, distinguish genuine detail from artefacts and choose the analysis method for binary or sinusoidal stars.

NBS 1952 Testing: Frequency, Magnification and False Resolution

Read three-bar groups correctly, convert target frequency to image frequency and distinguish a visual limit from contrast-transfer measurements.

NBS 1963A Infinity-Conjugate Testing

Use five-bar targets with a collimator, convert physical chart frequency into angular resolution and avoid conjugate, sampling and false-resolution errors.

Checkerboard Camera Calibration: Corners, Capture and Validation

Set corner counts and units correctly, capture useful poses and validate camera calibration beyond a single reprojection-error value.

Dot-Array Camera Calibration: Geometry, Detection and Validation

Define circle-grid coordinates, match OpenCV or HALCON settings and assess sampling, perspective centre bias and measurement accuracy.

Concentric-Square Targets: Scale, Centre and Distortion Checks

Set a reproducible µm-per-pixel scale, inspect centring and separate perspective from lens distortion with nested square references.

Optical Reticle Selection, Installation and Parallax

Choose the pattern by function, place it at the correct focal plane and verify scale, orientation, illumination and parallax in the complete instrument.

Reticle Focal Planes, Parallax and Optical Alignment

Understand where a reticle sits, how the observer sees it with the target and how focal-plane and alignment errors enter the instrument.

Reticles in Microscopes, Sights and Measuring Instruments

Match reticle geometry to the instrument task, then calibrate the complete optical configuration before reading length, angle, position or concentration.

Reticle Pattern Manufacture and Acceptance

Connect substrate, pattern transfer, focal-plane geometry and inspection so a reticle is checked as an optical component rather than only as a printed image.

Reticle Mounting and Cemented Optical Assemblies

Distinguish mechanical seating, edge bonding and full-face optical cementing, then control the pattern plane and verify the assembly after joining.

Glass Encoder Disc Selection: Codes, Readout and Eccentricity

Separate encoding type, optical readout, resolution and accuracy, then control concentricity, pitch and mounting error in the complete encoder system.

Reading USAF 1951 Targets: Groups, Frequency and Resolution

Read the correct three-bar element, convert its geometry and distinguish target-plane detail from image-plane sampling.

Slanted-Edge SFR: Setup, Calculation and Interpretation

Follow the edge-to-frequency calculation and identify how sampling, contrast and image processing affect the reported response.

Stage Micrometers: Scale Calibration and Measurement Records

Establish length per pixel or eyepiece division, choose a useful span and understand measured intervals and uncertainty.

Ronchi and Sayce Targets: Frequency, Sampling and Contrast

Relate stripe geometry to spatial frequency and use fixed-period or progressive patterns for controlled comparisons.

Encoder Periods, Counts, Resolution and Speed

Convert optical periods into count increments, estimate track pitch at the reading radius and check signal bandwidth at the required speed.

Absolute Optical Codes: Gray, Binary and Transition Reading

Match the position map to the reader, distinguish multi-track and coded-window designs, and evaluate code transitions and coarse/fine registration.

Optical Encoder Readheads: Signals and Interpolation

Understand the disc/readhead pair, clear fraction and phase signals, then distinguish interpolation increments from signal-dependent position error.

Encoder Pattern Manufacturing and Acceptance

Connect artwork, coating, pattern transfer and cutting to measurable track geometry, optical contrast and installed-system verification.

Using this guide

Use these technical guides to choose a component, select a material, prepare artwork, check installation and define acceptance.

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