Reference circles, dots or grids allow visual comparison of particle projections with a defined size series. Dark and clear features support different backgrounds.
Specify optical glass or fused silica, overall dimensions, thickness, pattern-side orientation and the clear aperture. Define transmission, reflectance or optical density at the working wavelength when optical contrast is critical.
Circles and reference outlines help sort visible particles into size classes. The procedure must define whether the comparison uses projected diameter, maximum extent or another dimension.
Calibrate eyepiece divisions against a stage scaleReference circles acquire a specimen-plane size through the installed magnification. Focus, illumination and overlapping particles affect the observed boundary, even when the reference geometry is unchanged.
Choose the pattern for the counting methodReference circles, dots or grids allow visual comparison of particle projections with a defined size series. Dark and clear features support different backgrounds.
Choose the required size bins and equivalent-diameter convention. A projected outline is not a direct measurement of particle volume or a three-dimensional diameter.
Sizing circles and reference features support visual comparison. A counting grid only partitions an area. Particle appearance also depends on focus, illumination and the measurement definition, such as projected diameter rather than physical volume.
Line geometry, graduations, labels, field diameter, substrate thickness and mounting outline can be matched to the instrument. Contrast and line density should allow the reference and the specimen to remain visible together.
A patterned glass reference component with the selected graduations, outline and mounting dimensions, accompanied by the specified inspection records.
Compare projected dust and particle dimensions.
Circles and field patterns for visual size comparison.
Particle-sizing reticles provide circles, scales or reference shapes for comparing apparent particle size in a microscope.
Match reference sizes to the observation method and calibrate the actual field. Define whether the reported size is a projection, diameter or another method-specific measure.
Reference dimensions, shape set, measurement method, magnification, field and mounting dimensions.
It gives a comparison size under a particular projection and method. Define particle size and reading rules using that method.