Ocular graticules for measurement, counting, size comparison and angular reference within microscope eyepieces.
An eyepiece reticle places a pattern at a suitable image plane in the viewing optics. The observer sees its reference lines together with the magnified specimen, supporting alignment, comparison and calibrated measurement.
Choose the geometry around the observation: crosshairs for centring, scales for length, grids for sampling and comparison patterns for a defined inspection method. Placement in the eyepiece or specimen plane changes how it is used.
Choose between an alignment reference, a graduated scale and a sampling grid by the quantity being observed. A pattern in the eyepiece and one at the specimen plane use different measurement relationships.
Line geometry, graduations, labels, field diameter, substrate thickness and mounting outline can be matched to the instrument. Contrast and line density should allow the reference and the specimen to remain visible together.
A patterned glass reference component with the selected graduations, outline and mounting dimensions, accompanied by the specified inspection records.
An eyepiece micrometer reticle places a graduated reference in the microscope image plane. It lets an operator measure particle lengths, fibre widths and small component features against a scale visible with the specimen.
Two graduated axes sharing an origin for X/Y measurement and centring inside an eyepiece.
Counting Grid Reticles for method-defined microscopy and counting. Compare pattern layouts and choose the configuration for your instrument.
Walton–Beckett Fibre-Counting Graticules for method-defined microscopy and counting. Compare pattern layouts and choose the configuration for your instrument.
Concentric-circle reticles place several circles around a common centre for optical centring and radial comparison. They help compare circular edges, projected diameters and the symmetry of a visible field.
Protractor Reticles for optical centring, aiming and alignment. Compare pattern layouts and choose the configuration for your instrument.
| Product type | When to choose it |
|---|---|
| Eyepiece Micrometer Reticles | Choose a single scale for measurements along one direction. Choose crossed scales for two perpendicular directions or for measurements that must share a common origin. Rotate the reference or specimen so the measured feature follows the scale axis. |
| Crossed-Scale Reticles | Choose a single scale for measurements along one direction. Choose crossed scales for two perpendicular directions or for measurements that must share a common origin. Rotate the reference or specimen so the measured feature follows the scale axis. |
| Counting Grid Reticles | Calibrate the specimen-plane cell area and set inclusion and exclusion rules for particles on boundaries. A planar grid does not define a liquid volume. |
| Walton–Beckett Fibre-Counting Graticules | Choose this family for a fibre-counting procedure that explicitly uses a Walton–Beckett field, with calibration at the actual microscope magnification. |
| Concentric Circle Reticles | Choose this pattern when the feature of interest is circular or when several radial limits must be visible together. Use a central cross or orientation mark when the centre also needs an independent reference. |
| Protractor Reticles | Use a protractor pattern when orientation or an included angle is the observation of interest, such as comparing edges and aligning a visible feature to an angular reference. |
Select measurement and counting patterns for an eyepiece.
Specify glass type, diameter, thickness, edge finish and the patterned surface. Match clear aperture and line width to the viewing optics. For an eyepiece installation, confirm the reticle seat and focus position before choosing the substrate thickness.
Microscope eyepiece reticles add scales, grids and reference patterns within the microscope viewing optics.
Choose a pattern for measuring, counting or comparison, and match eyepiece diameter and focal-plane position. Calibrate specimen dimensions with a stage micrometer.
Eyepiece fit, pattern, divisions, field, focal plane and objectives.
No. Its physical graduations must be related to specimen dimensions in the actual optical configuration, normally using a stage micrometer.