Square-Mesh TEM Specimen Grids
Square-mesh specimen supports for transmission electron microscopy.
Microscopy Components & Accessories
Specimen support grids, indexed films and counting chamber components. Choose the material and interface required by your microscopy workflow.
TEM Specimen Supports
Hexagonal TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Rectangular-Mesh TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
High-Open-Area TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Parallel-Bar TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
TEM Finder Grids
Finder TEM specimen grids for relocating observation areas.
TEM Coordinate Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Slotted TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Circular-Hole TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Specialist TEM Specimen Grids
A metal specimen-support grid provides physical openings for transmission electron microscopy. Its bars or surrounding frame support the specimen or a thin support film while leaving observation areas open.
Indexed Films & Counting Chamber Components
Specify the component interface
Confirm material, dimensions, sample support geometry, compatibility and inspection requirements. TEM supports, polymer indexing films and removable counting-chamber covers are distinct components.
Reticles & GraticulesRequest component informationNeed a calibration reference?
Microscope calibration slides and eyepiece graticules are also part of the measurement workflow. The reference slide sits at the specimen plane; the ocular micrometer is read in the eyepiece. Their product pages remain in the measurement and reticle ranges.
Match the sample interface
TEM specimen support grids, indexed film coverslips and counting chamber cover glasses serve different sample interfaces. Specify metal support geometry, polymer indexing layout or chamber fit according to the component being ordered.