Several measurement references share one field, such as straight scales, radii, angles or comparison circles. Each region has its own reading convention.
Specify optical glass or fused silica, overall dimensions, thickness, pattern-side orientation and the clear aperture. Define transmission, reflectance or optical density at the working wavelength when optical contrast is critical.
Length divisions, circles and angular marks can share one field so the operator compares several aspects of a feature without changing eyepieces. Each feature has its own reading rule.
Optical references in measuring instrumentsDense layouts can obscure the specimen or create ambiguous overlaps. Separate scale origins, labels and comparison fields, and calibrate any length-based references at the actual magnification.
Calibrate eyepiece divisions against a stage scaleSeveral measurement references share one field, such as straight scales, radii, angles or comparison circles. Each region has its own reading convention.
List the actual inspection tasks and choose only the features used by the operator. Define which regions require calibration and the magnification for each scale.
Eyepiece graduations are a relative scale until calibrated with a stage standard at the actual magnification. A crossed scale measures two directions; comparison circles and angle marks support different judgments from a length scale.
Graduation spacing, scale extent, crossed axes, numerals and comparison features can share a clear field.
A patterned glass reference component with the selected graduations, outline and mounting dimensions, accompanied by the specified inspection records.
Multi-Scale Inspection Reticles for microscope measurement and optical inspection. Compare pattern layouts and choose the configuration for your instrument.
Multi-scale inspection reticles combine several scales, circles or angle references on one substrate.
Give each pattern its own dimensions, location and identifier. Define which tasks share an origin and which use independent references.
Pattern list, individual scales, coordinates, numbering, active field, substrate and mounting datums.
Their physical dimensions are separately specified. Their corresponding specimen scales depend on the installed optical configuration.