Negative dot array calibration targets

Clear circular features on an opaque field. A transmitted-light reference for machine vision, camera calibration and coordinate measurement.

Discuss your drawingView technical specifications
Negative-polarity calibration plate with a regular bright-dot array on a dark field

A bright point on a dark field

With a suitable backlight, light passes through the circular openings in the patterned layer while the surrounding field remains dark. The camera captures the point array, and calibration software matches detected image centres to the physical coordinates in the target drawing.

Polarity matters: software set up for dark dots may need different detection settings for a bright-dot target.

Compare the full dot-array range

Why use a circle grid?

Locate each centre

Circle-boundary fitting or centroid calculation can estimate an image centre from multiple pixels. Subpixel repeatability depends on focus, sampling, contrast and the selected algorithm; it is not the same as the manufactured point-position tolerance.

Sample the full field

Dots distributed across the image support lens-distortion and scale analysis from centre to edge. Strong perspective or uneven backlighting can still shift detected centres and must be checked in the capture workflow.

Identify pattern orientation

A supported asymmetric grid can identify row order and target orientation from one image. Its staggered coordinates must match the software model; a symmetric grid cannot simply be substituted.

Technical specifications

Glass and film figures below describe available configurations. Ceramic values are included for comparison, but ceramic is for reflective targets and cannot transmit light through clear dots.

Negative-polarity pattern

Pattern polarityClear dots on an opaque field
Array layoutSymmetric or staggered; coordinates defined by drawing
IlluminationTransmitted light through the clear dots
Coordinate modelDot diameter, X/Y pitch, row/column order and origin follow the drawing
Glass target

Fused silica or soda-lime glass with a photolithographic dot pattern.

For this negative-polarity version, specify clear dots in the opaque coating. The optional white backing listed below is a separate glass configuration, not part of a transmitted-light target.

SubstrateFused silica / soda-lime glass
ProcessPhotolithography
Line-width tolerance±0.2 µm
Minimum feature width0.55 µm or 1 µm, by pattern configuration
Feature and overall accuracy±1 µm
Clear-area transmission>95% at 550 nm
Chrome finishYellow, low-reflection blue or bright chrome
Optical densityYellow chrome OD 3; blue chrome OD 5
Glass thickness1, 1.6, 2.3 or 3 mm (±0.2 mm)
Large-format glass thickness4.8 mm for the 500 × 500 mm format
Outline sizeFrom 2 × 2 mm up to 800 × 960 mm
Outline tolerance at maximum format±0.1 mm at 800 × 960 mm
Fused-silica expansion<5.0 × 10⁻⁷/K at 20–200°C
Low-reflection chrome reflectance<13.4% at 550 nm; <1.8% at 650 nm; <2.67% at 750 nm
Surface flatness<0.55 µm for lengths <50 mm; <2 µm for lengths <100 mm; <5 µm for lengths >100 mm
Chrome coating thickness120 ±5 nm (1200 ±50 Å)
Surface roughness<0.025 µm
Optional white backing40 µm coating; 10 µm minimum feature width
Outline shapeSquare
Pattern polarityOpaque dots or clear dots
Ceramic target

Opaque ceramic plates with matte or bright chrome patterns for reflective imaging.

Ceramic is opaque. Its figures apply to reflective dot-array targets and cannot make a backlit clear-dot negative plate.

SubstrateZirconia or alumina ceramic
ProcessPhotolithography
Line-width tolerance±0.2 µm
Pattern optionsMatte chrome on matte ceramic; bright chrome on glossy ceramic
Minimum feature width4 µm matte; 2 µm glossy
Feature accuracy±2 µm
Outline accuracy±0.05 mm
Ceramic thickness1 mm (±0.1 mm), 2 mm or 3 mm (±0.1 mm)
Outline sizeFrom 2 × 2 mm up to 228 × 228 mm
Outline size tolerance±0.1 mm at minimum and maximum formats
Flatness<30 µm below 100 mm; <60 µm below 200 mm
Chrome coatingMatte chrome or bright chrome
Chrome thickness120 ±5 nm (1200 ±50 Å)
Surface roughness0.2–0.7 µm
Thermal expansion<6.7 × 10⁻⁶/K at 40–400°C
Matte chrome reflectance<12.88% at 550 nm; <10.62% at 650 nm; <12.23% at 750 nm
Bright chrome reflectance<9.56% at 550 nm; <1.89% at 650 nm; <11.168% at 750 nm
Density≥3.66 g/cm³
Rockwell hardness≥80 HRA
Optional protectionThin protective layer above the chrome pattern
Edge and hole optionsLaser-cut outline, hole, chamfer or bevel
Pattern polarityOpaque pattern or clear pattern
Finish and shapeMatte or glossy; square, elliptical or drawing-defined cutouts
Photographic film target

A thin, lightweight format for larger patterns where mounting and ambient conditions are controlled.

Film can be selected for larger backlit patterns where mounting, temperature and humidity are controlled.

ProcessPhotographic-film lithography
ApplicationTransmitted-light or backlit functional testing
Minimum feature width10 or 30 µm
Feature accuracy±10 µm
Film thickness0.18 mm (±0.01 mm)
Temperature-related dimensional change10 µm per °C per metre
Environmental responseFilm dimensions also respond to humidity; control temperature and relative humidity during coordinate measurement
EmulsionSilver halide, approximately 2 µm
Clear-area transmission>90% across 400–700 nm
Optical densityOD >4 in solid black; grayscale density can be specified
Maximum format0.71 × 0.81 m at 10 µm minimum width; 1.68 × 3.5 m at 30 µm
Maximum-format tolerance±0.1 mm for both maximum formats
Pattern and cuttingBlack, grayscale or sinusoidal grayscale; straight, laser-cut or perforated outline

Where it is used

Camera calibration and 3D visionKnown physical circle coordinates across multiple views support estimation of camera intrinsics and lens distortion for monocular or stereo workflows.

Industrial metrology and photogrammetryA point field supports image-to-plane mapping and image-scale checks across large components or camera-guided assemblies when the target coordinate record is defined.

Robot hand-eye calibrationCapture the same target coordinate frame at recorded robot poses to solve the camera-to-robot transformation.

Define the coordinate pattern

A negative pattern changes the illumination contrast, not the meaning of its coordinates. For calibration, the physical point list and the detector order must agree.

GeometryDot diameter, X/Y centre pitch, rows, columns and coordinate origin.

OpticsWavelength, backlight, opaque-field density and pattern-side direction.

InspectionPoint positions, diameter, missing features and the measurement record required.

Before you order

Does a negative target require backlighting?

Clear dots are normally imaged with transmitted illumination. Confirm the wavelength, light uniformity and camera exposure for the actual setup.

Can the same detector read dark and clear dots?

Not always. The detector must support the selected contrast polarity and the same row and column coordinate order as the physical target.

Does the photograph define the manufactured dimensions?

No. Dot diameter, pitch, plate outline and position tolerances are defined by the approved drawing.

Send us your pattern

Share the point coordinates, polarity, glass dimensions and camera setup so the target can be matched to your detector.

Request a quote

Related calibration targets

Dot array calibration targetsCheckerboard calibration targets

Selection notes

Negative circle-grid targets use transmitting circular features in an opaque field for suitable backlit camera-calibration arrangements.

Confirm detector polarity and illumination before capture. Overexposure can enlarge apparent dots and bias centre estimates; retain complete, sharply resolved features across useful poses.

Information for your inquiry

Transmitting-dot diameter, centre spacing, layout, active area, material, working distance, backlight and detector.

Can I change to negative polarity without changing the capture setup?

Check the detector, illumination direction, exposure and the coordinate map. Polarity changes image contrast but does not replace the geometry needed for calibration.

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