Applications and compatible instruments
For image-scale checks, distortion evaluation, optical alignment and coordinate measurement in machine vision and microscopy.
Optical Resolution Chart, R1 Grid
Grid Calibration Target R1: For image-scale checks, distortion evaluation, optical alignment and coordinate measurement in machine vision and microscopy.
Choose by function
What it is and what it does
A grid target places known line intersections or square boundaries across an image field. It helps reveal geometric distortion, orientation and spacing differences while providing coordinates for a compatible calibration workflow.
When to choose it
Choose a grid to divide an observation field into known regions, compare spacing or support image-coordinate measurements. Use a counting chamber instead when a liquid volume must be defined.
How it differs from related products
A line grid makes spacing and field distortion visible over a broad area. Checkerboards and dot arrays provide features designed for their respective detection algorithms. Straight-looking grid lines alone do not establish a calibrated camera model.
What can be customised
Pattern size, feature spacing, polarity, usable field, substrate outline and mounting references can be selected around the camera and illumination. Measured geometry and traceable calibration are separate documentation requirements.
What you receive
A glass target in the selected pattern, polarity and substrate format, with the dimensional inspection or calibration records included in the order.
Product-specific applications and pattern selection
Details of this pattern
Configuration & ordering
- Pattern reference: R1; approved artwork and revision
- Active field, scale or feature geometry and optical-plane location
- Material, outside dimensions, thickness and mounting datums
- Working instrument, illumination and viewing side
- Critical tolerances, inspection intervals and reporting needs
Inspection & acceptance
Inspect intersections, cumulative pitch, orthogonality, line quality and usable-area flatness.
Quality & Inspection PhotolithographyWhere this product is used
Known feature positions for image scale and geometric calibration.
Common questions
Which details matter when comparing pattern variants?
Specify the X/Y pitches, usable field and reference coordinate file. Target flatness and fixture alignment help prevent apparent distortion from the target itself.
Selection notes
Grid Calibration Target R1: For image-scale checks, distortion evaluation, optical alignment and coordinate measurement in machine vision and microscopy.
Match this artwork reference to its labelled dimensions, polarity and active field. The product image, manufacturing artwork and inspection drawing should identify the same revision.
Information for your inquiry
Artwork reference, labelled geometry, active area, substrate outline, illumination and inspection requirements.
How do I distinguish this reference from another pattern in the same family?
Use the pattern reference and its specific geometry, labels and intended measurement. A similar outline or photograph does not establish the same frequency, coordinates or reading convention.