Applications and compatible instruments
For focus adjustment and comparison of directional sharpness in lenses, cameras and microscopes.
Optical Resolution Chart, R66 Star
Siemens Star Resolution Target R66: For focus adjustment and comparison of directional sharpness in lenses, cameras and microscopes.
Choose by function
What it is and what it does
Alternating radial sectors become narrower toward the centre, increasing the local tangential spatial frequency.
When to choose it
Use a star pattern to compare sharpness by direction, reveal a changing detail threshold toward the centre and make focus differences easy to see.
How it differs from related products
Radial sectors become finer toward the centre, exposing changes with orientation and radius in one field. USAF provides discrete labelled elements. A binary star and a sinusoidal star have different waveforms, so their analysis methods are not automatically interchangeable.
What can be customised
Sector count, active diameter, centre region, polarity and reference marks can be chosen around the field of view.
What you receive
A glass target in the selected pattern, polarity and substrate format, with the dimensional inspection or calibration records included in the order.
Product-specific applications and pattern selection
Details of this pattern
- Fine radial sectors extend directional comparisons toward smaller features. Sector count and centre exclusion define the usable annulus.
Configuration & ordering
- Pattern reference: R66; approved artwork and revision
- Active field, scale or feature geometry and optical-plane location
- Material, outside dimensions, thickness and mounting datums
- Working instrument, illumination and viewing side
- Critical tolerances, inspection intervals and reporting needs
Inspection & acceptance
Check sector angles, centre, polarity and the smallest usable features outside the excluded centre.
Quality & Inspection PhotolithographyWhere this product is used
Compare focus and resolved detail with this optical test pattern.
Common questions
Which details matter when comparing pattern variants?
For N line pairs around a circle, frequency at radius r is N/(2πr). Specify the central exclusion region and sector count. Binary-star contrast requires a suitable analysis method.
Selection notes
Siemens Star Resolution Target R66: For focus adjustment and comparison of directional sharpness in lenses, cameras and microscopes.
Match this artwork reference to its labelled dimensions, polarity and active field. The product image, manufacturing artwork and inspection drawing should identify the same revision.
Information for your inquiry
Artwork reference, labelled geometry, active area, substrate outline, illumination and inspection requirements.
How do I distinguish this reference from another pattern in the same family?
Use the pattern reference and its specific geometry, labels and intended measurement. A similar outline or photograph does not establish the same frequency, coordinates or reading convention.